• National Institute of Research and Development for Optoelectronics INOE 2000: Spin coater (SPIN PROCESSOR, MODEL WS- 650SZ-LORELL), and pulsed laser deposition (PLD 2000-PVD Products Ltd), furnace L1206 M (CALORIS, Romania), FT-IR spectrophotometer (Perkin Elmer, Spectrum 100), micro Raman spectrometer (Horiba-Jobin Yvon, LABRAM HR 800), UV-Vis spectrophotometer (Perkin Elmer, Lambda 1050), Ellipsometer (Horiba Jobin Yvon, UVISEL). Edinburgh Instruments FLS 920 Spectrofluorimeter (Vis range), Horiba Jobin Yvon   Spectrofluorimeter Fluorolog- 3

  • National Institute of Lasers, Plasma and Radiation Physics. Balzers BA 510, RF magnetron-sputtering VARIAN ER 3119, Leybold electron gun, BALZERS QMG 100, quadrupolar mass spectrometer; NOMAD, USA, atomic force microscope; Carl Zaiss Jena optical microscope, DRON DART-UM X-ray diffractometer, Carl Zeiss Jena, UV-VIZ-NIR-IR; FTIR Perkin-Elmer spectrophotometer, FEI/Phillips USA scanning electron microscopy (SEM)/transmission electron microscopy (TEM), Möller interferometer, Precission impedance analizer 4294, USA, chemical laboratory chamber, Nabertherm and Linton electrical furnaces, Shimadzu analitical balance .

  • National Institute of Materials Physics. X-ray diffraction by using D8 ADVANCE diffractometer type (BRUKER-AXS Germany, 2007), scanning electron microscopy (SEM Carl Zeiss EVO 50 XVP), transmission electron microscopy (TEM), HRTEM JEM ARM 200F, JEM ARM 200F electron microscope, SQUID magnetometer manufactured by Quantum Design (USA), Physical Property Measurement System, (PPMS) QD-PPMS-14, MOKE (magneto-optic Kerr effect) set-up.

  • University Politehnica of Bucharest. Equipments for experimentation (evaluated at aprox.3.000.000 Euros) available at University Politehnica Bucharest from 3MN Platform laboratories, are: SCHIMADZU XRD 6000 X-Ray diffractometer; Fritsch Particle Seizer Analysette 22 Laser granulometer; NETZSCH DIL-402 PC dilatometer, MATEST Cyber-Tronic compression and flexural testing machine 250 kN/15kN; Christ Alpha 2-4 Freeze dryer; FOX 314 Thermal conductivity Analyser for building material ; HITACHI S2600N - Scanning electron microscope and sample preparation kit; GEMINI V - BET porosimeter; Shimadzu DTG-TA-50H and DTA 50 Thermal analyser; SHIMADZU FTIR 8400 FTIR spectroscope; TECNAI F30 S-Twin - High resolution transmission electron microscope – HRTEM, Thermo EVOLUTION 300 UV-Vis spectrometer operates in transmission or diffuse reflectance mode and kinetic module; PASCAL 240/140 Porosimeter with Hg; Pulverisette Ball Mill; HotIsostaticPress; Pyrosol installation; Sol-gel installation; Autoclave; Ovens, Vibration table & Jolting apparatus.

  • Pro Optica S.A.: refractometer Abbe and Pulfrich,goniometer Moller,interferometers PSI 300 and BIH, set-up Senarmont, photometer Spectra Pritchard, spectrophotometer Lambda 35, elipsometric set-up PSA, reflecting conoscope and optical bench from C.Z.Jena.